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Proceedings Paper

Application of fuzzy evidence theory in a photo-electric measurement system
Author(s): Jianxun Song; Maotao Xiong; Jin Zhang; Qinzhang Wu
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Paper Abstract

The photo-electric measurement system is a kind of high-precision measurement system for trajectory parameters and object identity parameters, and it can acquire the image information of flying objects by CCD camera. Due to subject to some kinds of reasons, the feature information of image is not integrated and imprecise, and it has uncertainty and fuzzy in some degree. The Dempster-Shafer evidence theory is an important approach of uncertainty reasoning. With evidences fused, the uncertainty of the feature information of the object is declined gradually by Dempster combination rule, so it can achieve the aim of object detection and object recognition. The conception of fuzzy mass is expanded in the way of the relation of absolute membership on the basis of normal mass conception. The fuzzy theory is very suitable for the description and processing of uncertainty to evidences in D-S evidence theory, so the Basic Probability Assignment Function (BPAF) of D-S evidence theory can be acquired according to fuzzy theory, and it resolves crucial problem in D-S evidence theory. It is shown that data fusion method of fuzzy evidence theory can deal with uncertainty and the fuzzy of photo-electric measurement system according to the analysis of theory and the result of experimentation, and it has a bright future in photo-electric measurement systems.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72833L (20 May 2009); doi: 10.1117/12.828779
Show Author Affiliations
Jianxun Song, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Maotao Xiong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Jin Zhang, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Qinzhang Wu, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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