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Proceedings Paper

Micro-spectroscopy system based on common inverted microscope to measure UV-VIS spectra of a micro-area
Author(s): Ailing Yang; Jinliang Zhang; Weiwei Ren; Mingming Tang
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Paper Abstract

For measuring UV-VIS spectra of a micro-area, an upright triocular UV microscope has to be generally used and reequipped by the user. This greatly increased the cost of the experimental system and might make the microscope lose the function of taking a photograph. In this paper, a new micro-spectroscopy system is established for measuring fluorescence of a micro-area. This system includes in a reflective microscope objective(RMO), a fiber cable, a microlens, a 3D adjustable fiber-microlens-microscope adaptor(FMMA), a fluorescence meter and a common inverted fluorescence microscope(IFM). The cheap and common IFM replaced an expensive UV upright microscope and no need to rebuild the microscope itself. Except for the FMMA, all the other elements are standard products. All elements are easily integrated into a whole, so the cost of the system is greatly decreased. The space resolution of this system is 2μm. This system can be used to localize a micro-area, excite it with a monochromatic light, take a photograph of it, collect wake fluorescence of it and measure its UV-VIS spectra. This system is stable and has a high sensitivity. It is promising to measure the fluorescence of a mineral grain, the organic matters in a micro-fracture, or a single fluid inclusion. Because it used an IFM, it can also to be used to the biology samples, such as cell or bio-inclusion. We used this system to measure the UVVIS spectrum of oils in a single micro-fracture of a mineral slice and the spectra of a single mineral grain in a mineral slice.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72833A (20 May 2009); doi: 10.1117/12.828768
Show Author Affiliations
Ailing Yang, Ocean Univ. of China (China)
Jinliang Zhang, Ocean Univ. of China (China)
Beijing Normal Univ. (China)
Weiwei Ren, Ocean Univ. of China (China)
Mingming Tang, Ocean Univ. of China (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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