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Proceedings Paper

Scattering property of rough surface of silicon solar cells
Author(s): Lu Bai; Zhensen Wu; Shuangqing Tang; Yongqiang Pan
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Paper Abstract

In this paper, the correlations properties of silicon solar cells are measured, the nanoscale roughness surface high fluctuation coordinate function distribution is obtained. Based on the Kirchhoff approximates method, numerical results of this material are presented. The correlation between coherent and incoherent scattering intesities along the incident or the scattering angle is also discussed.

Paper Details

Date Published: 20 May 2009
PDF: 4 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728338 (20 May 2009); doi: 10.1117/12.828766
Show Author Affiliations
Lu Bai, Xidian Univ. (China)
Xi'an Technological Univ. (China)
Zhensen Wu, Xidian Univ. (China)
Shuangqing Tang, Xidian Univ. (China)
Yongqiang Pan, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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