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Proceedings Paper

Iterative estimation of phase distribution on reference planes in grating projection profilometry
Author(s): Xiaoling Zhang; Baofeng Zhang; Yuchi Lin; Dongmei Liu; Xiaofei Li
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Paper Abstract

The unwrapped phase distribution on reference planes with different heights in grating project profilometry are analyzed and synthesized. Then a two-parameter second-order rational polynomial to express the uneven phases on every plane is proposed. A first-order Taylor series expansion is employed to obtain the polynomial coefficients of rational polynomial based on least-square iterative estimation method. By this method, phases on all the reference planes are retrieved precisely and extended to the full field. The results of experiences proved that the method not only can retrieve the phases distribution on the full field from parts reference planes, but geometrical parameter error, real reference plane profile error and random error are decreased, and coordinate measuring precision is also increased.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728337 (20 May 2009); doi: 10.1117/12.828765
Show Author Affiliations
Xiaoling Zhang, Tianjin Univ. of Technology (China)
Baofeng Zhang, Tianjin Univ. of Technology (China)
Yuchi Lin, Tianjin Univ. (China)
Dongmei Liu, Tianjin Univ. of Technology (China)
Xiaofei Li, Tianjin Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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