Share Email Print
cover

Proceedings Paper

Method of circle detection in PCB optics image based on improved point Hough transform
Author(s): Naosheng Qiao; Yutang Ye; Yonglin Huang; Lin Liu; Yulin Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The cause and method of pre-treatment of PCB optics image in the optics image detection were given at firstly; The method of circle detection based on traditional Hough transform (THT) was analyzed, and it's shortcomings were given; To overcome these shortcomings, a method which calls piont Hough transform (PHT) to evaluate the parameters of the circle was adopted, and it's basic principle was analyzed in detail., It has some advantages such as small amount of data, high precision and fast speed, but it has some shortcomings also. Accordingly, a method for evaluating the parameters of the circle based on improved PHT (IPHT) was proposed, which features smaller amount of data and faster speed than the method of the circle detection of the PHT; At last, the result of experiment for the circle detection of PCB optics image verified the superiority of the method.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832Y (20 May 2009); doi: 10.1117/12.828736
Show Author Affiliations
Naosheng Qiao, Univ. of Electronic Science and Technology of China (China)
Hunan Univ. of Arts and Science (China)
Yutang Ye, Univ. of Electronic Science and Technology of China (China)
Yonglin Huang, Univ. of Electronic Science and Technology of China (China)
Lin Liu, Univ. of Electronic Science and Technology of China (China)
Yulin Wang, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top