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Proceedings Paper

Evaluation of dim target detection and tracking algorithms
Author(s): Yong Zhang; Mao-tao Xiong; Qin-zhang Wu
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Paper Abstract

Although there are many dim target detection and tracking algorithms, they have different adaption to tasks' content and quality. There is almost no a unified algorithm of target detection and tracking. Reliance on Automated Target Recognition (ATR) technology is essential to future success of system reasoning and development. In labs, these algorithms and their combination can be properly evaluated and optimized, and outfield tests and cost may be decreased. How to analyze and evaluate these algorithms becomes an important problem of ATR. A framework of algorithms' evaluation has been established. The parameterized simulation method of dim targets has also been proposed. This method synthesizes simulated targets and the simulated or real background, varying the SNR(Signal Noise Ratio) and TA(Target Area),etc, and produces quantifiable images. To evaluate the dim target detection or image pretreatment algorithms for a single target and multiple false alarms, an effective approach SROC (Summary Receiver Operator Characteristic) based on the ROC (Receiver Operator Characteristic) model has been improved and employed. The dimension of FAR(False Alarm Rate) has been renewedly defined to adapt to the multiple false alarms. The SROC model develops and quantifies the ROC model, and obtain a single performance evaluation value, which can better quantitatively evaluate ATR algorithms. Further, the FROC(Free Receiver Operator Characteristic)model is appropriate when multiple dim detections are possible and the number of false alarms is unconstrained. The FROC model provides a qualified method for characterizing both the operational environment and the ability of the ATR algorithm to detect targets. The FROC model also effectively valuates the detection performance in the situation of single dim target - multiple false alarms. Tests show the methods are applicable and available in optimizing ATR algorithms and their combination applications.

Paper Details

Date Published: 20 May 2009
PDF: 7 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832W (20 May 2009); doi: 10.1117/12.828734
Show Author Affiliations
Yong Zhang, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Chongqing Technology and Business Univ. (China)
Mao-tao Xiong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Qin-zhang Wu, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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