Share Email Print
cover

Proceedings Paper

Study on energy loss compensation of back scattering conical cavity high-energy laser energy meter
Author(s): Xun Yu; Hui Wang; Xiao-yan Shang; Liang Nie; Bao-yuan Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Because absolute quantity thermal laser energy meter based on conical cavity has some features, for example, wide wavelength adaptation range, high laser damage threshold value, extensive measuring energy range and so on, it is often used as the standard of high-energy laser energy meter, and is used extensively in the domain of high energy laser measurement. But, laser energy will lose because of back scattering of conical absorption cavity. So, only after the loss is compensated and amended, exact measurement of laser energy can be achieved. Aiming at energy loss compensation problem of conical cavity high-energy laser energy meter, we firstly, according to speckle statistics optical theory, analyze the back scattering of the conical absorption cavity in condition of uniform distribution laser incident on diffuse reflection surface, and secondly, we aim at high power laser's output facula shape: round, based on optical principles of interaction of the conical cavity inner face and the incident laser and utilize complexfication Simpson numerical method, the mathematical models of optical power density distribution at open-end of conical cavity and back scattering gross power are established. On this basis, the measured result is compensated and amended. The back scattering energy loss is about 0.5% to 2.5%.High-energy laser energy measuring accuracy is improved effectively.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72832A (20 May 2009); doi: 10.1117/12.828705
Show Author Affiliations
Xun Yu, Xi'an Technological Univ. (China)
Hui Wang, Xi'an Technological Univ. (China)
Xiao-yan Shang, Xi'an Technological Univ. (China)
Liang Nie, Xi'an Technological Univ. (China)
Bao-yuan Liu, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top