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Proceedings Paper

Method for recovering dynamic position of photoelectric encoder
Author(s): Yong-zhi Wu; Qiu-hua Wan; Chang-hai Zhao; Ying Sun; Li-hui Liang; Yi-sheng Liu
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Paper Abstract

This paper presents a method to recover dynamic position of photoelectric encoder. While working at dynamic state, original outputs of the photoelectric encoder are in theory two sine or triangular signals with a phase difference of π/2. However, there are still deviations of actual output signals. Interpolating on the basis of this deviation signal will result in interpolation errors. In dynamic state, true original signal data obtained by data acquisition system is a time equation. Through processing these data by data equiangular and harmonic analysis, the equation will be converted from time domain to position domain and an original position equation can be formed. Then the interpolation errors also can be obtained. By this method, the interpolation errors can be checked in dynamic state and it can also provide electric interpolation basis so that to improve dynamic interpolation precision of the encoder. Software simulation and experimental analysis all prove the method effective. This method is the basis in theory for precision checking and calibration in motion.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728328 (20 May 2009); doi: 10.1117/12.828703
Show Author Affiliations
Yong-zhi Wu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Qiu-hua Wan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Chang-hai Zhao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Ying Sun, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Li-hui Liang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yi-sheng Liu, National Ctr. of Quality Supervision and Inspection of Automobile Spare Parts (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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