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Proceedings Paper

Set of axes compensation and measurement between multitudinous photoelectric instruments under shape changing carrier
Author(s): Jing Wang; Wen-jian Chen; Jun Han; Xun Yu
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Paper Abstract

The set of axes compensation and measurement between multitudinous photoelectric instruments is represented in this paper, these photoelectric instrument is installed in the stuffless, proteiform ship, armored car shell, or some instrumentation and command systems, the set of axes precision between these photoelectric instrument need be insured, the compensation method dealing with the stochastic shape change is introduced in this paper. The principle is described as follows: it begins that the deformation amount of each installation site is acquired utilizing inertial measurement unit, then, the coordinate system of two photoelectric instrument is rotated according to the deformation amount, the coordinate system of one photoelectric instrument is treated as standard, the other one is formed by rotating the standard coordinate system twice and three times, finally, the other photoelectric instrument is compensated utilizing matrix manipulation method, adapting to the deformation environment of dynamic random is the characteristic of the compensation method, so the measurement system have the ability of real time simulating deformation and measuring compensation effect, the measurement of simulating the continuous deformation utilizing the three-axis stable platform and measuring compensation effect utilizing the zenith tube is introduced in this work, the three-dimensional analog deformation is achieved utilizing coordinate vector method, finally, the compensation method and measuring method is testified by experiment.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728324 (20 May 2009); doi: 10.1117/12.828696
Show Author Affiliations
Jing Wang, Xi'an Technological Univ. (China)
Wen-jian Chen, Xi'an Institute of Applied Optics (China)
Jun Han, Xi'an Technological Univ. (China)
Xun Yu, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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