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Proceedings Paper

Method for obtaining real temperature of space object by using the ratio of emissivity at different wavelengths
Author(s): Guo-qiang Wang; Tao Chen; Jian-li Wang
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Paper Abstract

The infrared radiation character (temperature and efficiency radiation area) of a space object is an important characteristic, we can judge the state of the object working in orbit by measuring temperature and variety. Due to lower temperature of the object and far distance between the object and the earth, the infrared radiation signal is faintness, therefore temperature and the infrared radiation character is difficult to measure. There are several methods to measure the temperature of the object in theory and each one has its applicability respectively, such as applying Wien Law to compute temperature, based on Stefan-Bolzmann law to compute temperature and utilizing multi-spectrum detector to measure temperature As a whole these methods are based on the hypothesis that the object is a Black-body or the radiance emissivity is constant. In fact, homochromatic radiance of object is not a constant but a function that changes with wavelength. Since the problem that an object whose homochromatic radiance is not a constant which results in temperature can not be computed accurately, we bring forward a method to contrast the luminance of the object at different wavelengths and deduce the relationship among homochromatic radiance and wavelength and the temperature of Black-body, from which we can compute real temperature of object.

Paper Details

Date Published: 20 May 2009
PDF: 4 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728322 (20 May 2009); doi: 10.1117/12.828694
Show Author Affiliations
Guo-qiang Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Tao Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jian-li Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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