Share Email Print
cover

Proceedings Paper

Dynamic evaluation system for interpolation errors in the encoder of high precision
Author(s): Qiu-hua Wan; Yong-zhi Wu; Chang-hai Zhao; Li-hui Liang; Ying Sun; Yong Jiang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In order to measure dynamic interpolation errors of photoelectric encoder of high precision, the dynamic evaluation system of interpolation errors is introduced. Firstly, the fine Moiré signal of encoder which is collected with the high-speed data gathering card into the computer is treated to equiangular data with the method of linear interpolation. Then, the analysis of harmonic wave with the FFT is processed. Compared with the standard signal, the dynamic interpolation errors of the encoder are calculated. Experimental results show that the precision of the dynamic evaluation system of interpolation errors is ±0.1 %( pitch). The evaluation system is simple, fast, high precision, and can be used in the working field of the encoder.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728321 (20 May 2009); doi: 10.1117/12.828693
Show Author Affiliations
Qiu-hua Wan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yong-zhi Wu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Chang-hai Zhao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Li-hui Liang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Ying Sun, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yong Jiang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top