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Proceedings Paper

Study on adjustment technique of optical-axis parallelism in multibeam axes optoelectronic system
Author(s): Jun Han; Jing Wang; Wen-jiang Chen; Xun Yu
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Paper Abstract

A kind of adjustment on the complicated Optoelectronic system with visible, laser, and rotative mechanical axis is discussed in this paper. This is the adjustment of multispectral spatial rotation optical axis, the characteristics is not only the parallelism adjustment of optical axis where relative rotaton movement occurs, but also the danger of invisible highenergy laser, the harmful invisible laser is simulated by the visible light camera aimed at the danger; the principle and method of the optical axis calibration finely with dual-optical wedge for guaranteeing the high parallelism depth between laser and visible optical axis in the discretional azimuth is introduced in this paper: the special rotative adjustment pedestal and the reference light source is designed and processed, the error of the different spatial relative position between camera axis and visual axis is detected by turning the rotative pedestal; In this work, the mathematical model aiming at the dual-optical wedge adjustment technique is constructed ,in which the rationality is confirmed by MATLAB program, and the convenience, the maneuverability and the useful value of the adjustment technique is also illustrated for the parallel precision of 0.1mrad in between laser and visible light axis.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72831K (20 May 2009); doi: 10.1117/12.828670
Show Author Affiliations
Jun Han, Xi'an Technological Univ. (China)
Jing Wang, Xi'an Technological Univ. (China)
Wen-jiang Chen, Xi'an Institute of Applied Optics (China)
Xun Yu, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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