Share Email Print
cover

Proceedings Paper

Study on interferom etry with grating m odulating optical fiber interference fringes phase
Author(s): Qiang Dai; Yande Xu; Yijun Liang; Tao Geng; Ronggang Zhu; Wen Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A novel sinusoidal phase m odulating optical fiber interferom eters is described. The surface profile of an object can be measured by grating m odulating optical fiber interference fringes. The ± first-order beam s diffracted by the grating are coupled in two fibers and in optical fiber output two coherent point light source are generated. The two coherent point light sources have the sam e intensity so as to high contrast interference fringes are got. W hen piezoelectric ceram ic vibrates with the grating, the position of ± first-order beam s diffracted by the grating does not change but the phase of optical fiber output field interference fringes change periodic. By using sinusoidal phase modulating method can detect the phase variations of interference fringes and the surface profile of an object can be measured. Detail description about the optical principle, optical path design and phase m odulating and dem odulation are researched. The experiment show s that this measurem ent method can overcom e fluctuate of light source intensity and wavelengths at the sam e time have the characteristic of high precision and large non-contact measurem ent range.

Paper Details

Date Published:
PDF
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72834Q; doi: 10.1117/12.828660
Show Author Affiliations
Qiang Dai, Harbin Engineering Univ. (China)
Yande Xu, Harbin Engineering Univ. (China)
Yijun Liang, Harbin Engineering Univ. (China)
Tao Geng, Harbin Engineering Univ. (China)
Ronggang Zhu, Harbin Engineering Univ. (China)
Wen Li, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

© SPIE. Terms of Use
Back to Top