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Proceedings Paper

Distortion measurement and calibration technology research of automatic observing and aiming optical system based on CCD
Author(s): Xun Yu; Qian Li; Xiao-yan Shang; Liang Nie; Ji-an Wu
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Paper Abstract

With the development of science and technology, especially advanced technology, the requirement to observing and aiming optical system is higher responsibility and accuracy, more intelligence, so wide-field and short-focal-length CCD camera system is used widely in the observing and aiming optical device, which is the important part of this device. But accurate calibration of forming-image system distortion is the key, and the distortion quantitative measurement must be finished. In this paper, firstly the high performance electronic target is established whose advantages are high contrast, high brightness, excellent uniformity and so on by use of TFT-LCD space optical modulator and visible image display technology. On basis of this, the distortion measurement system is formed to measure the automatic observing and aiming optical system based on CCD. Then polynomial model is established by applying the inversion algorithm and the measured distortion is calibrated by the least squares fit. The calibrated result shows that the measurement precision using the inversion polynomial algorithm is higher than that using the positive one obviously and the average distortion after calibration is better than 0.11%.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728319 (20 May 2009); doi: 10.1117/12.828656
Show Author Affiliations
Xun Yu, Xi'an Technological Univ. (China)
Qian Li, Xi'an Technological Univ. (China)
Xiao-yan Shang, Xi'an Technological Univ. (China)
Liang Nie, Xi'an Technological Univ. (China)
Ji-an Wu, Xi’an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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