Share Email Print
cover

Proceedings Paper

Quantitative measurement of optical surfaces using an improved knife edge
Author(s): Hongwei Jing; Wei Yang; Bin Fan; Yongjian Wan; Shibin Wu; Fan Wu; Tianquan Fan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

One of the oldest techniques for sensing optical abberations is Foucault knife edge test. Qualitative properties of knife edge test have been utilized over the past 150 years to assess the quality of an optic or optical system. Much work and analysis have been performed since Foucault,but no satisfactory results have been found. This paper describes a method that upgrades the knife edge tester from a qualitative tester to a quantitative tester.Firstly,the traditional knife edge tester is upgraded to an improved one enabling the knife to cut the focus from horizontal direction and vertical direction.Secondly,the 2 sets of shadows were integrated to form complete mirror shadows.Finally,a mathematical model is established to quantitatively evaluate the surface error from the shadows. An experiment has been done using the method. The calculated deviations of the optical surface are compared with the results measured by ZYGO interferometer. Two measurement results show resemblance.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830W (20 May 2009); doi: 10.1117/12.828620
Show Author Affiliations
Hongwei Jing, Institute of Optics and Electronics (China)
Wei Yang, Institute of Optics and Electronics (China)
Bin Fan, Institute of Optics and Electronics (China)
Yongjian Wan, Institute of Optics and Electronics (China)
Shibin Wu, Institute of Optics and Electronics (China)
Fan Wu, Institute of Optics and Electronics (China)
Tianquan Fan, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

© SPIE. Terms of Use
Back to Top