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Proceedings Paper

Effect of threshold value on high reflectivity measurement with optical feedback cavity ring-down technique
Author(s): Yuan Gong; Yanling Han; Bincheng Li
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Paper Abstract

The influence of a predefined threshold value on high reflectivity measurement in an optical feedback cavity ring-down technique (OF-CRD) is investigated. The strong optical feedback from the front cavity mirror of a linear ring-down cavity is re-injected into the oscillator cavity of the diode laser and causes line-width reduction of diode laser. The narrowed laser line is occasionally in resonance with one or more ring-down cavity modes and large resonant peaks are observed in the ring-down cavity output signals. The diode laser is switched off at the negative step of the square-wave modulation signal. If the amplitude at the negative step exceeds the pre-defined threshold value, an exponential decay signal is recorded to fit the cavity decay time. The reflectivity of the cavity mirror is determined statistically to be 99.9907±0.0002% and 99.9899±0.0004% with threshold values of 350mV and 50mV, respectively. All reflectivities measured at six cavity lengths with a higher threshold are more precise than that measured with the lower threshold. A method to determine the threshold value is proposed for accurate high reflectivity measurement.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830U (20 May 2009); doi: 10.1117/12.828618
Show Author Affiliations
Yuan Gong, Institute of Optics and Electronics (China)
Graduate School of the Chinese Academy of Sciences (China)
Yanling Han, Institute of Optics and Electronics (China)
Bincheng Li, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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