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Proceedings Paper

New method of fiber Bragg grating demodulation technique and applied in detection of equipment
Author(s): Bing Zhao; Zhi-Li Zhang; Qi-Yuan Zhong; Hongliang Tu; Lilong Tan
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Paper Abstract

Numbers of temperature signal and both dynamic and static strain signal in different places should be detected in fault diagnosis of some equipment system. Fiber Bragg Grating sensor was provided usefully as detection instrument for fault diagnosis of equipment system, but the demodulation technique in existence couldn't satisfy multi-dots and multi-parameters detection of the system. F-P scan method amalgamated non-balance M-Z method was advanced by expatiating two kinds of demodulation technique and their merits and defects. By this method, wavelength demarcation technique used in F-P scan method was combined with M-Z method. Center wavelength of strain sensor was accurately confirmed in static state, so diversification quantity and currently value of parameter could be demodulated in M-Z method when came in for vibrancy action. Time-Division multiplexed technique could be used to enhance the sensor number in M-Z demodulation technique. The design of demodulation circuit and yawp control technique were afforded, and the system's power loss was analyzed. It was indicated that the method not only realized the detection of multi-dots of temperature and static strain signal, but also dynamic parameter of real-time detection of equipment system, so the merits of both FP scan method and non-balance M-Z method it contained. The technique was provided for Fiber Bragg Grating sensor used in fast detection of equipment system.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72830N (20 May 2009); doi: 10.1117/12.828606
Show Author Affiliations
Bing Zhao, Xi'an Research Institute of High Technology (China)
Zhi-Li Zhang, Xi’an Research Institute of High Technology (China)
Qi-Yuan Zhong, Xi’an Research Institute of High Technology (China)
Hongliang Tu, Xi’an Research Institute of High Technology (China)
Lilong Tan, Xi’an Research Institute of High Technology (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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