Share Email Print
cover

Proceedings Paper

Multifocus microscope image fusion analysis based on Daubechies wavelets
Author(s): Alfonso Padilla-Vivanco; Carina Toxqui-Quitl; C. Santiago-Tepantlan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We present in this work a multifocus image fusion algorithm based on wavelet transforms applied to multifocus microscopy images acquired by the bright-field technique. The fusion scheme is based on the Daubechies family transforms. Experimental results are presented using metallic samples.

Paper Details

Date Published: 17 June 2009
PDF: 8 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73893G (17 June 2009); doi: 10.1117/12.828484
Show Author Affiliations
Alfonso Padilla-Vivanco, Univ. Politécnica de Tulancingo (Mexico)
Carina Toxqui-Quitl, Univ. Politécnica de Tulancingo (Mexico)
Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
C. Santiago-Tepantlan, Univ. Politécnica de Tulancingo (Mexico)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

© SPIE. Terms of Use
Back to Top