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Proceedings Paper

Orthonormal vector polynomials in a unit circle, application: fitting mapping distortions in a null test
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Paper Abstract

We developed a complete and orthonormal set of vector polynomials defined over a unit circle. One application of these vector polynomials is for fitting the mapping distortions in an interferometric null test. This paper discusses the source of the mapping distortions and the approach of fitting the mapping relations, and justifies why the set of vector polynomials is the appropriate choice for this purpose. Examples are given to show the excellent fitting results with the polynomials.

Paper Details

Date Published: 21 August 2009
PDF: 8 pages
Proc. SPIE 7426, Optical Manufacturing and Testing VIII, 74260V (21 August 2009); doi: 10.1117/12.828288
Show Author Affiliations
Chunyu Zhao, College of Optical Sciences, The Univ. of Arizona (United States)
James H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7426:
Optical Manufacturing and Testing VIII
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)

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