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Proceedings Paper

Non-null interferometric system for general aspheric test
Author(s): Dong Liu; Yongying Yang; Chao Tian; Lin Wang; Yongmo Zhuo
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Paper Abstract

Aspheric design and fabrication have obtained great achievements with the fast developments of modern science and technology, especially computer science, while the test of aspherics has become a chief limitation of aspheric applications. Due to the arbitrary nature of aspherics, test of all aspherics with only one instrument seems impossible. This paper presents a non-null interferometric system that can be applied for general aspheric test. The systematic error of non-null aspheric test system is studied, according to which an error separating and correcting method is proposed then. Computer simulation shows the error correcting method can correct the systematic error of non-null aspheric test system effectively and efficiently. Experiments have been carried out with the proposed interferometric non-null aspheric test system and the results show the system can greatly increase the accuracy of the non-null aspheric test.

Paper Details

Date Published: 20 May 2009
PDF: 6 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728305 (20 May 2009); doi: 10.1117/12.828283
Show Author Affiliations
Dong Liu, Zhejiang Univ. (China)
Yongying Yang, Zhejiang Univ. (China)
Chao Tian, Zhejiang Univ. (China)
Lin Wang, Zhejiang Univ. (China)
Yongmo Zhuo, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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