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Proceedings Paper

Development of a parallelism tester for visible and infrared compound system
Author(s): Hongwei Jing; Shibin Wu; Qiang Chen; Boping Lei; Jibin Jiang; Ke Mei
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Paper Abstract

A parallelism tester is developed to measure the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester is composed of visible system, infrared system, cassegrain autocollimator, imaging and data processing system and 5D workshop. The visible system generates visible light. The infrared system generates the infrared light. The visible light and infrared light are auto-collimated by the Cassegrain auto-collimator. During measurement the autocollimated light is directed into the optical path of the compound system being tested ,which passes through the compound system being tested and back to the tester. The visible light is used for targetting and infrared light is used for measurement. An 5D workshop is used for adjustment. The imaging and data processing system detects the deviation of infrared light spots and calculate the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester can be used to measure the parallelism of visible optical axis and infrared optical axis of visible and infrared compound system. The calibrated accuracy of the tester is 3 arc second.

Paper Details

Date Published: 20 May 2009
PDF: 5 pages
Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728303 (20 May 2009); doi: 10.1117/12.828281
Show Author Affiliations
Hongwei Jing, Institute of Optics and Electronics (China)
Shibin Wu, Institute of Optics and Electronics (China)
Qiang Chen, Institute of Optics and Electronics (China)
Boping Lei, Institute of Optics and Electronics (China)
Jibin Jiang, Institute of Optics and Electronics (China)
Ke Mei, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7283:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang, Editor(s)

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