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Proceedings Paper

Inferring the orientation of texture from polarization parameters
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Paper Abstract

It is shown that once the diffusely scattered polarization properties are calibrated, the texture orientation can be calculated directly from diattenuation and retardance. Polarization scattering properties are studied for a rough aluminum surface with one-dimensional rough texture and well-defined orientation. Functions of Mueller matrix elements related to sample orientation about the normal via the arctangent function are investigated. The Mueller matrix bidirectional reflectance distribution function is measured for a linearly sanded aluminum sample. Sinusoidal fits to the Mueller matrix show that the angular orientation of the data can be recovered explicitly from its properties.

Paper Details

Date Published: 12 August 2009
PDF: 6 pages
Proc. SPIE 7461, Polarization Science and Remote Sensing IV, 746109 (12 August 2009); doi: 10.1117/12.828261
Show Author Affiliations
Hannah Noble, College of Optical Sciences, The Univ. of Arizona (United States)
Wai-Sze Lam, College of Optical Sciences, The Univ. of Arizona (United States)
Russell A. Chipman, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7461:
Polarization Science and Remote Sensing IV
Joseph A. Shaw; J. Scott Tyo, Editor(s)

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