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Proceedings Paper

Combined stereovision and phase shifting method: use of a visibility-modulated fringe pattern
Author(s): Xu Han; Peisen Huang
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Paper Abstract

We propose to use a visibility-modulated fringe pattern to enable real-time image acquisition in the newly proposed combined stereovision and phase shifting method for 3-D shape measurement. The combined stereovision and phase shifting method uses two cameras and one projector and can eliminate errors caused by inaccurate phase measurement, such as periodic errors due to the nonlinearity of the projector's gamma curve. In order to achieve pixel-to-pixel matching between the two cameras, we previously used two phase-shifted fringe patterns, one with fringes in the vertical direction and the other in the horizontal direction. This means that the projected fringe pattern has to be switched during the image acquisition process, which slows down the process. As a result, measurement of dynamically changing objects is difficult. In this paper, we propose to use a visibility-modulated fringe pattern to eliminate the need of the second fringe pattern. This new fringe pattern is sinusoidal in the horizontal direction as in a conventional fringe pattern, but is visibility-modulated in the vertical direction. With this new pattern, we can obtain the phase information in one direction and fringe visibility information in the other direction simultaneously for stereo matching. Since no pattern changing is necessary during the image acquisition process, the image acquisition time can be reduced to less than half of the time previously required, thus making the measurement of dynamically changing objects possible. Experimental results are presented to demonstrate the effectiveness of the proposed method.

Paper Details

Date Published: 17 June 2009
PDF: 10 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73893H (17 June 2009); doi: 10.1117/12.828227
Show Author Affiliations
Xu Han, Stony Brook Univ. (United States)
Peisen Huang, Stony Brook Univ. (United States)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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