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Proceedings Paper

Optical characteristics of a one-dimensional photonic crystal with an additional regular layer
Author(s): V. A. Tolmachev; A. V. Baldycheva; E. Yu. Krutkova; T. S. Perova; K. Berwick
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Paper Abstract

In this paper, the forbidden Photonic Band Gaps (PBGs) of a one-dimensional Photonic Crystal (1D PC) with additional regular layer, t for the constant value of the lattice constant A and at normal incident of light beam were investigated. The additional regular layer was formed from both sides of the high-refractive index layer H. The gap map approach and the Transfer Matrix Method were used for numerical analysis of this structure. The limitation of filling fraction values caused by the presence of t-layer was taking into account during calculations of the Stop-Band (SB) regions for threecomponent PC. The red shift of SBs was observed at the introduction of t-layer to conventional two-component 1D PC with optical contrast of N=3.42/1. The blue edge of the first PBG occupied the intermediate position between the blue edges of SBs regions of conventional PCs with different optical contrast N. This gives the opportunity of tuning the optical contrast of PC by introduction of the additional layer, rather than using the filler, as well as fine tuning of the SB edge. The influence of the number of periods m and the optical contrast N on the properties of SBs was also investigated. The effect of the PBG disappearance in the gap map and in the regions of the PBGs of high order was revealed at certain parameters of the additional layer.

Paper Details

Date Published: 17 June 2009
PDF: 10 pages
Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 739017 (17 June 2009); doi: 10.1117/12.828222
Show Author Affiliations
V. A. Tolmachev, Trinity College Dublin (Ireland)
Ioffe Physico-Technical Institute (Russian Federation)
A. V. Baldycheva, Trinity College Dublin (Ireland)
E. Yu. Krutkova, Trinity College Dublin (Ireland)
T. S. Perova, Trinity College Dublin (Ireland)
K. Berwick, Dublin Institute of Technology (Ireland)

Published in SPIE Proceedings Vol. 7390:
Modeling Aspects in Optical Metrology II
Harald Bosse; Bernd Bodermann; Richard M. Silver, Editor(s)

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