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Proceedings Paper

Design and development of the optics system for the NHXM Hard X-ray and Polarimetric Mission
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Paper Abstract

The New Hard X-ray Mission (NHXM) Italian project will be operated by 2016. It is based on 4 hard X-ray optics modules, each formed by 60 evenly spaced multilayer coated Wolter I mirror shells. For the achievement of a long focal length (10 m) an extensible bench is used. The pseudo-cylindrical Wolter I monolithic substrates where the multilayer coating is applied will be produced using the Ni electroforming replica approach. For three of the four mirror modules the focal plane will host a hybrid a detector system, consisting in the combination of a Si-based low energy detector (efficient from 0.5 up to ~ 15 keV) , on top of a high energy CdTe pixellated detector (efficient from 10 keV up to ~ 80 keV); the two cameras will be surrounded by both a passive shield and an anticoincidence shield. The total on axis effective area of the three telescopes at 1 keV and at 30 kev is of 1500 cm2 and 350 cm2 respectively. The angular resolution requirement is better than 20 arcsec HEW at 30 keV, while the Field of View at 50% vignetting is 12 arcmin (diameter). The payload is finally completed with the fourth telescope module, that will have as a focal plane detector a high sensitivity imaging photoelectric polarimetric system, operating from 2 up to 35 keV. In this paper, after an overview of the mission configuration and its scientific goals, we report on the design and development of the multilayer optics of the mission, based on thin replicated Ni mirror shells.

Paper Details

Date Published: 31 August 2009
PDF: 12 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 743704 (31 August 2009); doi: 10.1117/12.828142
Show Author Affiliations
Giovanni Pareschi, INAF-Osservatorio Astronomico di Brera (Italy)
Gianpiero Tagliaferri, INAF-Osservatorio Astronomico di Brera (Italy)
Primo Attinà, Thales Alenia Space (Italy)
Stefano Basso, INAF-Osservatorio Astronomico di Brera (Italy)
Giuseppe Borghi, Media Lario Technologies (Italy)
Oberto Citterio, INAF-Osservatorio Astronomico di Brera (Italy)
mEDIA lARIO tECHNOLOGIES (Italy)
Marta Civitani, INAF-Osservatorio Astronomico di Brera (Italy)
Vincenzo Cotroneo, INAF-Osservatorio Astronomico di Brera (Italy)
Barbara Negri, Agenzia Spaziale Italiana (Italy)
Giorgia Sironi, INAF-Osservatorio Astronomico di Brera (Italy)
Media Lario Technologies (Italy)
Daniele Spiga, INAF-Osservatorio Astronomico di Brera (Italy)
Dervis Vernani, INAF-Osservatorio Astronomico di Brera (Italy)
Media Lario Technologies (Italy)
Giuseppe Valsecchi, Media Lario Technologies (Italy)


Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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