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Proceedings Paper

Ball bearing measurement with white light interferometry
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Paper Abstract

Requirements on high-performance of ball bearings in terms of the loads they experience and their reliability are increasing as the automotive, aerospace, and power generation industries look to cut costs, reduce emissions, and improve efficiency. Most bearings are evaluated with a stylus profiler or with a bright field scopes or microscopes for form, roughness, and defect classification. Two-dimensional stylus measurements captures only very localized surface profiles unless multiple scans are performed which slow the measurement time unacceptably; this leads to inadequate sampling and sometimes greatly varying results based on location and directionality of the line scan. Bright field microscopes deliver only the lateral information about defects but not their depth, volume or surface roughness. White light interferometry can be very successfully utilized in the measurement of full field form, roughness and defect detection and is gaining adoption. They provide rapid, accurate, three-dimensional imaging compatible with the newly developed ISO 3D surface parameters which are expected to rapidly displace traditional 2D metrics. These surface parameters allow for better characterization of surface structure and better understanding of the production process and bearing and race wear. New 3D filtering techniques allow effective separation of form, waviness, and roughness for highly accurate and repeatable bearing qualification.

Paper Details

Date Published: 17 June 2009
PDF: 12 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890P (17 June 2009); doi: 10.1117/12.828113
Show Author Affiliations
Joanna Schmit, Veeco Instruments Inc. (United States)
Sen Han, Veeco Instruments Inc. (United States)
Erik Novak, Veeco Instruments Inc. (United States)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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