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Proceedings Paper

Digital holographic characterization of liquid microlenses array fabricated in electrode-less configuration
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Paper Abstract

We show how thin liquid film on polar dielectric substrate can form an array of liquid micro-lenses. The effect is driven by the pyroelectric effect leading to a new concept in electro-wetting (EW). EW is a viable method for actuation of liquids in microfluidic systems and requires the design and fabrication of complex electrodes for suitable actuation of liquids. When compared to conventional electrowetting devices, the pyroelectric effect allowed to have an electrode-less and circuitless configuration. In our case the surface electric charge induced by the thermal stimulus is able to pattern selectively the surface wettability according to geometry of the ferroelectric domains micro-engineered into the lithium niobate crystal. We show that different geometries of liquid microlenses can be obtained showing also a tuneability of the focal lenses down to 1.6 mm. Thousand of liquid microlenses, each with 100 μm diameter, can be formed and actuated. Also different geometries such as hemi-cylindrical and toroidal liquid structures can be easily obtained. By means of a digital holography method, an accurate characterization of the micro-lenses curvature is performed and presented. The preliminary results concerning the imaging capability of the micro-lens array are also reported. Microlens array can find application in medical stereo-endoscopy, imaging, telecommunication and optical data storage too.

Paper Details

Date Published: 17 June 2009
PDF: 8 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891I (17 June 2009); doi: 10.1117/12.828034
Show Author Affiliations
L. Miccio, Istituto Nazionale di Ottica Applicata, CNR (Italy)
V. Vespini, Istituto Nazionale di Ottica Applicata, CNR (Italy)
S. Grilli, Istituto Nazionale di Ottica Applicata, CNR (Italy)
M. Paturzo, Istituto Nazionale di Ottica Applicata, CNR (Italy)
A. Finizio, Istituto di Cibernetica Eduardo Caianiello, CNR (Italy)
S. De Nicola, Istituto di Cibernetica Eduardo Caianiello, CNR (Italy)
P. Ferraro, Istituto Nazionale di Ottica Applicata, CNR (Italy)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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