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Proceedings Paper

Off-plane grating spectrometer for the International X-ray Observatory
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Paper Abstract

A dispersive spectrometer onboard the International X-ray Observatory (IXO) provides a method for high throughput and high spectral resolution at X-ray energies below 1 keV. An off-plane reflection grating array maximizes these capabilities. We present here a mature mechanical design that places the grating array on the spacecraft avionics bus 13.5 m away from the focal plane. In addition, we present the technology development plan for advancing the Technology Readiness Level to 6 for the Off-Plane X-ray Grating Spectrometer.

Paper Details

Date Published: 31 August 2009
PDF: 13 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74370H (31 August 2009); doi: 10.1117/12.827980
Show Author Affiliations
Randall L. McEntaffer, Univ. of Iowa (United States)
Neil J. Murray, Open Univ. (United Kingdom)
Andrew Holland, Open Univ. (United Kingdom)
Charles Lillie, Northrop Grumman Space Technology (United States)
Suzanne Casement, Northrop Grumman Space Technology (United States)
Dean Dailey, Northrop Grumman Space Technology (United States)
Tim Johnson, Northrop Grumman Space Technology (United States)
Webster C. Cash, Univ. of Colorado at Boulder (United States)
Phillip H. Oakley, Univ. of Colorado at Boulder (United States)
Ted Schultz, Univ. of Iowa (United States)
David N. Burrows, Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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