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Proceedings Paper

Optimized square Fresnel zone plates for microoptics applications
Author(s): José María Rico-García; Francisco Javier Salgado-Remacha; Luis Miguel Sanchez-Brea; Javier Alda
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Paper Abstract

Polygonal Fresnel zone plates with a low number of sides have deserved attention in micro and nanoptics, because they can be straightforwardly integrated in photonic devices, and, at the same time, they represent a balance between the high-focusing performance of a circular zone plate and the easiness of fabrication at micro and nano-scales of polygons. Among them, the most representative family are Square Fresnel Zone Plates (SFZP). In this work, we propose two different customized designs of SFZP for optical wavelengths. Both designs are based on the optimization of a SFZP to perform as close as possible as a usual Fresnel Zone Plate. In the first case, the criterion followed to compute it is the minimization of the difference between the area covered by the angular sector of the zone of the corresponding circular plate and the one covered by the polygon traced on the former. Such a requirement leads to a customized polygon-like Fresnel zone. The simplest one is a square zone with a pattern of phases repeating each five zones. On the other hand, an alternative SFZP can be designed guided by the same criterion but with a new restriction. In this case, the distance between the borders of different zones remains unaltered. A comparison between the two lenses is carried out. The irradiance at focus is computed for both and suitable merit figures are defined to account for the difference between them.

Paper Details

Date Published: 17 June 2009
PDF: 8 pages
Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 739011 (17 June 2009); doi: 10.1117/12.827546
Show Author Affiliations
José María Rico-García, Univ. Complutense de Madrid (Spain)
Francisco Javier Salgado-Remacha, Univ. Complutense de Madrid (Spain)
Luis Miguel Sanchez-Brea, Univ. Complutense de Madrid (Spain)
Javier Alda, Univ. Complutense de Madrid (Spain)


Published in SPIE Proceedings Vol. 7390:
Modeling Aspects in Optical Metrology II
Harald Bosse; Bernd Bodermann; Richard M. Silver, Editor(s)

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