Share Email Print
cover

Proceedings Paper

Fourier domain optical coherence tomography for high-precision profilometry
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A Fourier domain (FD) optical coherence tomography (OCT) system is shown to be capable of profilometry with two orders of magnitude better accuracy than the axial imaging resolution of the system. High precision OCT profilometry not only achieves similar accuracy as commercial white light interferometry based profilometers but is also capable of profilometry on complex subsurface structures with multiple interfaces of low reflectance. An accuracy of 55nm was achieved with a ThorLabs SROCT on a lab bench without special anti-vibration devices. This technique has the potential for a range of applications, such as high precision refractive index measurements and simultaneous dynamic monitoring of the interface structure of a drying varnish and the substrate.

Paper Details

Date Published: 7 July 2009
PDF: 12 pages
Proc. SPIE 7391, O3A: Optics for Arts, Architecture, and Archaeology II, 73910H (7 July 2009); doi: 10.1117/12.827518
Show Author Affiliations
Samuel Lawman, Nottingham Trent Univ. (United Kingdom)
Haida Liang, Nottingham Trent Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 7391:
O3A: Optics for Arts, Architecture, and Archaeology II
Luca Pezzati; Renzo Salimbeni, Editor(s)

© SPIE. Terms of Use
Back to Top