Share Email Print
cover

Proceedings Paper

Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A vision system is used for measuring in-plane target displacement, position and orientation. Pseudo-periodic patterns fixed on the target forms a phase reference. Absolute position is determined with subpixel accuracy by phase computations. Various position encoding designs are proposed for different displacement ranges and resolution. Performances obtained are compared and discussed for both displacement and orientation measurements. The capability to resolve position on depth ranges larger than the lens depth of focus is demonstrated.

Paper Details

Date Published: 17 June 2009
PDF: 8 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891N (17 June 2009); doi: 10.1117/12.827485
Show Author Affiliations
July A. Galeano Zea, Institut FEMTO-ST, CNRS, Univ. de Franche-Comté (France)
Patrick Sandoz, Institut FEMTO-ST, CNRS, Univ. de Franche-Comté (France)


Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

© SPIE. Terms of Use
Back to Top