Share Email Print

Proceedings Paper

Inspection of misalignment factors in lens assembly
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The misalignment of a particular optic in lens assembly will induce aberrations and deteriorate the performance. For the purpose of failure analysis, there are requirements from optic manufactures for the development of measurement tool to address the misaligned element. This paper presents a method for the quantitative measurement and analysis of misalignment in lens assembly, which may figure out the misaligned element and its misalignment factors. Since there are several optical elements in lens assembly, and there are different misalignments, such as decenter, tilt etc, a multiparameter tool need to be employed in the analysis. Wavefront can be expressed with Zernike polynomials, which are selected for the analysis. We choose a positive lens assembly with four elements for the study. A point light source is placed in the front focus point of lens assembly; the collimated emergent wavefront is analyzed with Zernike polynomials. We use Zeemax to simulate the propagation of wavefront, calculate Zernike coefficients correspondent to various misalignment. The results show there is a group of Zernike polynomials correspond to each misalignment. Each polynomial increase/decrease progressively against the magnitude of misalignment. It is difficult to tell the misalignment only by the analysis of Zernike coefficients. To further address the misaligned elements, we present a concept - the contrast value of Zernike coefficients, which is a series of constant even though the magnitude of misalignment changes. The method and procedure is presented to measure the contrast value with the employment of dual directional wavefront sensing.

Paper Details

Date Published: 17 June 2009
PDF: 12 pages
Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 739006 (17 June 2009); doi: 10.1117/12.827446
Show Author Affiliations
Xiang Li, A*STAR Singapore Institute of Manufacturing Technology (Singapore)
Liping Zhao, A*STAR Singapore Institute of Manufacturing Technology (Singapore)
Zhong Ping Fang, A*STAR Singapore Institute of Manufacturing Technology (Singapore)

Published in SPIE Proceedings Vol. 7390:
Modeling Aspects in Optical Metrology II
Harald Bosse; Bernd Bodermann; Richard M. Silver, Editor(s)

© SPIE. Terms of Use
Back to Top