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Proceedings Paper

Radiation source considerations relevant to next-generation x-ray diffraction imaging for security screening applications
Author(s): G. Harding; H. Strecker; S. Olesinski; K. Frutschy
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Paper Abstract

X-ray diffraction imaging (XDi) refers to the volumetric analysis of extended, inhomogenous objects by spatially-resolved x-ray diffraction. Following a brief description of some of the areas in which x-ray diffraction (XRD) is currently impacting on the detection of materials of interest in the security environment, the principles of energy-dispersive x-ray diffraction tomographic systems of the 1st, 2nd and 3rd generation are described. The Multiple Inverse Fan Beam (MIFB) topology for 3rd Generation XDi, in which the XRD properties of a 2-D spatial array of volume elements are investigated in parallel without mechanical scanning, is described. 3rd Generation XDi is being driven among other things by technological developments taking place in the field of Multi-Focus X-ray Sources (MFXS) from which representative results are presented. MFXS source requirements for Next-Generation MIFB XDi are summarized and the potential of 3rd Generation XDi for rapid, accurate and affordable screening in the Checkpoint and Hold Baggage environments is summarized.

Paper Details

Date Published: 11 September 2009
PDF: 11 pages
Proc. SPIE 7450, Penetrating Radiation Systems and Applications X, 745007 (11 September 2009); doi: 10.1117/12.827049
Show Author Affiliations
G. Harding, GE Security Germany GmbH (Germany)
H. Strecker, GE Security Germany GmbH (Germany)
S. Olesinski, GE Security Germany GmbH (Germany)
K. Frutschy, GE Global Research (United States)

Published in SPIE Proceedings Vol. 7450:
Penetrating Radiation Systems and Applications X
F. Patrick Doty; H. Bradford Barber; Hans Roehrig; Richard C. Schirato, Editor(s)

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