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Proceedings Paper

Phase retrieval from a single interferometric pattern to determine the profile caused by laser ablation on spherical surfaces
Author(s): M. I. Rodríguez-Rodríguez; E. López-Olazagasti; M. A. Rosales; Jorge Ibarra; E. Tepichín
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Paper Abstract

We have been working in the interferometric analysis of the ablation profile obtained with different techniques of refractive surgery, applied directly on hard contact lenses. We have demonstrated qualitatively that different ablations produce different fringe patterns; implying different focal shifts1. These results were obtained by means of a Mach- Zehnder type interferometer, where we used a similar unablated contact lens as a reference. Due to the size of each sample, it is difficult to get different fringe patterns with different phase factors. Therefore, the typical phase shifting methods are not suitable in our case. To determine the corresponding profile caused by the different ablation techniques we applied in this work the interpolation method that provide an analysis of static fringe patterns. This method of phase retrieval allows us to obtain the PSF and MTF related to each profile. The advantage of this procedure is that we can obtain a time invariant performance of the resulting ablated surface.

Paper Details

Date Published: 2 September 2009
PDF: 10 pages
Proc. SPIE 7443, Applications of Digital Image Processing XXXII, 74431K (2 September 2009); doi: 10.1117/12.826644
Show Author Affiliations
M. I. Rodríguez-Rodríguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
E. López-Olazagasti, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
M. A. Rosales, Univ. de las Américas Puebla (Mexico)
Jorge Ibarra, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
E. Tepichín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)

Published in SPIE Proceedings Vol. 7443:
Applications of Digital Image Processing XXXII
Andrew G. Tescher, Editor(s)

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