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Proceedings Paper

Progress toward a complete metrology set for the International X-ray Observatory (IXO) soft x-ray mirrors
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Paper Abstract

We present an overview update of the metrologic approach to be employed for the segmented mirror fabrication for the IXO soft x-ray telescope. We compare results achieved to date with mission requirements. This is discussed in terms of inherent capability versus in-practice capability. We find that all the needed metrology equipment are in hand but that a number of the needed quantities remain too uncertain relative to mission requirements. This is driven by the mounting of the mirrors themselves. We then discuss some plans for addressing the mirror mounting issues. Finally, we also briefly discuss some promising mandrel metrology techniques.

Paper Details

Date Published: 31 August 2009
PDF: 9 pages
Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74370R (31 August 2009); doi: 10.1117/12.826625
Show Author Affiliations
J. P. Lehan, Univ. of Maryland, Baltimore County (United States)
NASA Goddard Space Flight Ctr. (United States)
M. Atanossova, NASA Goddard Space Flight Ctr. (United States)
Oak Ridge Associated Univ. (United States)
K.-W. Chan, NASA Goddard Space Flight Ctr. (United States)
Univ. of Maryland, Baltimore County (United States)
T. Hadjimichael, NASA Goddard Space Flight Ctr. (United States)
Ball Aerospace (United States)
T. T. Saha, NASA Goddard Space Flight Ctr. (United States)
M. Hong, NASA Goddard Space Flight Ctr. (United States)
SCT, Inc. (United States)
W. W. Zhang, NASA Goddard Space Flight Ctr. (United States)
P. Blake, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 7437:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV
Stephen L. O'Dell; Giovanni Pareschi, Editor(s)

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