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Proceedings Paper

Pyretic test and breakdown test for c-Si PV cells and single-cell PV modules
Author(s): T. Doi; T. Yamada; K. Ikeda
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Paper Abstract

There are many factors which are assumed to be concerned in the PV module deterioration. We have to understand phenomena, modes, factors and mechanism, and then we have to build a stress acceleration method. As the first step of this study, we conducted the forward voltage applying test and reverse biased breakdown test of c-Si PV cells. Then, we extended the method into single-cell PV modules. After the breakdown test, we measured the I-V characteristics, and then it was found that the shape of I-V curves are categorized into four types as follows: 1) decrease of shunt resistor, 2) linear, 3) suspected normal and 4) the others. We will report some important experimental results and we propose an idea for new acceleration method to PV module deterioration such as cell burn or interconnector failure.

Paper Details

Date Published: 20 August 2009
PDF: 11 pages
Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120X (20 August 2009); doi: 10.1117/12.826554
Show Author Affiliations
T. Doi, National Institute of Advanced Industrial Science and Technology (Japan)
T. Yamada, National Institute of Advanced Industrial Science and Technology (Japan)
K. Ikeda, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 7412:
Reliability of Photovoltaic Cells, Modules, Components, and Systems II
Neelkanth G. Dhere; John H. Wohlgemuth; Dan T. Ton, Editor(s)

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