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Paper Abstract

One of the main challenges to obtain the contrast of >15mag targeted by an extra-solar planet imager like SPHERE lies in the calibration of all the different elements participating in the final performance. Starting with the calibration of the AO system and its three embedded loops, the calibration of the non-common path aberrations, the calibration of the NIR dual band imager, the NIR integral field spectrograph, the NIR spectrograph, the visible high accuracy polarimeter and the visible imager all require sophisticated calibration procedures. The calibration process requires a specific extensive calibration unit that provides the different sources across the spectrum (500-2320nm) with the stabilities and precisions required. This article addresses the challenges met by the hardware and the instrument software used for the calibration of SPHERE.

Paper Details

Date Published: 20 August 2009
PDF: 11 pages
Proc. SPIE 7440, Techniques and Instrumentation for Detection of Exoplanets IV, 74400Q (20 August 2009); doi: 10.1117/12.826535
Show Author Affiliations
Francois Wildi, Observatoire de Genève (Switzerland)
David Mouillet, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
Jean-Luc Beuzit, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
Markus Feldt, Max-Planck-Institut für Astronomie (Germany)
Kjetil Dohlen, Observatoire Astronomique de Marseille-Provence (France)
Thierry Fusco, Office National d'Etudes et de Recherches Aérospatiales (France)
Cyril Petit, Office National d'Etudes et de Recherches Aérospatiales (France)
Silvano Desidera, Osservatorio Astronomico di Padova (Italy)
Raffaele Gratton, Osservatorio Astronomico di Padova (Italy)
Hans-Martin Schmid, ETH Zürich (Switzerland)
Maud Langlois, Observatoire Astronomique de Marseille-Provence (France)
A. Vigan, Observatoire Astronomique de Marseille-Provence (France)
Julien Charton, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
Riccardo Claudi, Osservatorio Astronomico di Padova (Italy)
Ronald Roelfsema, ASTRON (Netherlands)
Andrea Baruffolo, Osservatorio Astronomico di Padova (Italy)
Pascal Puget, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)


Published in SPIE Proceedings Vol. 7440:
Techniques and Instrumentation for Detection of Exoplanets IV
Stuart B. Shaklan, Editor(s)

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