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Proceedings Paper

Strained enabled ferroelectricity in CaTiO3 thin films probed by nonlinear optics and scanning probe microscopy
Author(s): Eftihia Vlahos; Amit Kumar; Sava Denev; Charles Brooks; Darrell G. Schlom; Carl J. Eklund; Karin M. Rabe; Craig J. Fennie; Venkatraman Gopalan
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Proc. SPIE 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III, 74050N; doi: 10.1117/12.826457
Show Author Affiliations
Eftihia Vlahos, The Pennsylvania State Univ. (United States)
Amit Kumar, The Pennsylvania State Univ. (United States)
Sava Denev, The Pennsylvania State Univ. (United States)
Charles Brooks, The Pennsylvania State Univ. (United States)
Darrell G. Schlom, The Pennsylvania State Univ. (United States)
Carl J. Eklund, Rutgers Univ. (United States)
Karin M. Rabe, Rutgers Univ. (United States)
Craig J. Fennie, Cornell Univ. (United States)
Venkatraman Gopalan, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 7405:
Instrumentation, Metrology, and Standards for Nanomanufacturing III
Michael T. Postek; John A. Allgair, Editor(s)

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