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Proceedings Paper

The Extreme Ultraviolet Sensor (EUVS) for GOES-R
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Paper Abstract

Recognizing that the solar extreme ultraviolet (EUV) irradiance is an important driver of space weather, the National Oceanic and Atmospheric Administration (NOAA) has added an Extreme Ultraviolet Sensor (EUVS) to its Geostationary Operational Environmental Satellite (GOES) program, starting with the recently launched GOES-N, now designated GOES-13. For the GOES-R series (slated for launch starting in 2015) , the EUVS measurement concept has been redesigned. Instead of measuring broad bands spanning the EUV, the GOES-R EUVS will measure specific solar emissions representative of coronal, transition region, and chromospheric variability. From these measurements, the geo-effective EUV wavelength range from 5 to 127 nm can be reconstructed using models based on spectrally resolved measurements gathered over the full range of solar variability. An overview of the GOES-R EUVS design is presented. A description of the in-flight degradation tracking utilizing similar measurement and modeling techniques used to generate the EUV irradiance is also provided.

Paper Details

Date Published: 23 September 2009
PDF: 8 pages
Proc. SPIE 7438, Solar Physics and Space Weather Instrumentation III, 743804 (23 September 2009); doi: 10.1117/12.826445
Show Author Affiliations
Francis G. Eparvier, Lab. for Atmospheric and Space Physics, Univ. of Colorado at Boulder (United States)
David Crotser, Lab. for Atmospheric and Space Physics, Univ. of Colorado at Boulder (United States)
Andrew R. Jones, Lab. for Atmospheric and Space Physics, Univ. of Colorado at Boulder (United States)
William E. McClintock, Lab. for Atmospheric and Space Physics, Univ. of Colorado at Boulder (United States)
Martin Snow, Lab. for Atmospheric and Space Physics, Univ. of Colorado at Boulder (United States)
Thomas N. Woods, Lab. for Atmospheric and Space Physics, Univ. of Colorado at Boulder (United States)


Published in SPIE Proceedings Vol. 7438:
Solar Physics and Space Weather Instrumentation III
Silvano Fineschi; Judy A. Fennelly, Editor(s)

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