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Proceedings Paper

Application of the Talbot effect for three-dimensional and step-height measurement using an LCD
Author(s): Elizabeth Vela-Esparza; Gustavo Ramírez-Zavaleta; Marco Antonio Rosales-Medina; Ponciano Rodríguez-Montero; Eduardo Tepichín-Rodríguez
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Paper Abstract

The self-imaging phenomenon under coherent illumination or Talbot effect has been widely used in different fields including optical metrology. According to the Talbot effect, when a periodic grating is illuminated with spatially and temporary collimated coherent light, the grating is self-imaged at a certain distance, ZT, which depends on the inverse of the wavelength λ of the incident light and the square of the period, d, of the grating. This means that they can be seen at different positions ZT by changing either d or λ. Using the wavelength dependence of the self-images, and a fixed period, d, an application of the Talbot effect for three-dimensional and step-height measurement using a two-wavelength laser, appeared recently in the literature. We propose in this work to use an LCD to display a tunable grating. In our setup, we used a fixed wavelength and a dynamic 1-D grating to adjust the step-height measurement capabilities. We also analyze the possibility of measuring continuously varying surfaces with this technique. We include the preliminary results of our proposal.

Paper Details

Date Published: 1 September 2009
PDF: 12 pages
Proc. SPIE 7442, Optics and Photonics for Information Processing III, 74420F (1 September 2009); doi: 10.1117/12.826396
Show Author Affiliations
Elizabeth Vela-Esparza, Univ. de las Américas Puebla (Mexico)
Gustavo Ramírez-Zavaleta, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Marco Antonio Rosales-Medina, Univ. de las Américas Puebla (Mexico)
Ponciano Rodríguez-Montero, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Eduardo Tepichín-Rodríguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 7442:
Optics and Photonics for Information Processing III
Khan M. Iftekharuddin; Abdul Ahad Sami Awwal, Editor(s)

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