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Proceedings Paper

Zirconia coated carbonyl iron particle-based magnetorheological fluid for polishing
Author(s): Shai N. Shafrir; Henry J. Romanofsky; Michael Skarlinski; Mimi Wang; Chunlin Miao; Sivan Salzman; Taylor Chartier; Joni Mici; John C. Lambropoulos; Rui Shen; Hong Yang; Stephen D. Jacobs
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Paper Abstract

Aqueous magnetorheological (MR) polishing fluids used in magnetorheological finishing (MRF) have a high solids concentration consisting of magnetic carbonyl iron particles and nonmagnetic polishing abrasives. The properties of MR polishing fluids are affected over time by corrosion of CI particles. Here we report on MRF spotting experiments performed on optical glasses using a zirconia coated carbonyl iron (CI) particle-based MR fluid. The zirconia coated magnetic CI particles were prepared via sol-gel synthesis in kg quantities. The coating layer was ~50-100 nm thick, faceted in surface structure, and well adhered. Coated particles showed long term stability against aqueous corrosion. "Free" nano-crystalline zirconia polishing abrasives were co-generated in the coating process, resulting in an abrasivecharged powder for MRF. A viable MR fluid was prepared simply by adding water. Spot polishing tests were performed on a variety of optical glasses over a period of 3 weeks with no signs of MR fluid degradation or corrosion. Stable material removal rates and smooth surfaces inside spots were obtained.

Paper Details

Date Published: 22 August 2009
PDF: 12 pages
Proc. SPIE 7426, Optical Manufacturing and Testing VIII, 74260B (22 August 2009); doi: 10.1117/12.826383
Show Author Affiliations
Shai N. Shafrir, OptiPro Systems (United States)
Univ. of Rochester (United States)
Henry J. Romanofsky, Univ. of Rochester (United States)
Michael Skarlinski, Univ. of Rochester (United States)
Mimi Wang, Univ. of Rochester (United States)
Chunlin Miao, Univ. of Rochester (United States)
Sivan Salzman, Univ. of Rochester (United States)
Taylor Chartier, Univ. of Rochester (United States)
Joni Mici, Univ. of Rochester (United States)
John C. Lambropoulos, Univ. of Rochester (United States)
Rui Shen, Univ. of Rochester (United States)
Hong Yang, Univ. of Rochester (United States)
Stephen D. Jacobs, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 7426:
Optical Manufacturing and Testing VIII
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)

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