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Proceedings Paper

Atomic force microscopy (AFM) characterization of 4 A single walled carbon nanotubes
Author(s): Zunfeng Liu; Linhua Jiang; Chi Ting Fung; Jan Pieter Abrahams
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Proc. SPIE 7399, Carbon Nanotubes, Graphene, and Associated Devices II, ; doi: 10.1117/12.826380
Show Author Affiliations
Zunfeng Liu, Leiden Univ. (Netherlands)
Linhua Jiang, Leiden Univ. (Netherlands)
Chi Ting Fung, Leiden Univ. (Netherlands)
Jan Pieter Abrahams, Leiden Univ. (Netherlands)


Published in SPIE Proceedings Vol. 7399:
Carbon Nanotubes, Graphene, and Associated Devices II
Manijeh Razeghi; Didier Pribat; Young-Hee Lee, Editor(s)

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