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Proceedings Paper

Progress in the development of compact high-repetition-rate soft x-ray lasers: gain saturation at 10.9 nm and first demonstration of an all-diode-pumped soft x-ray laser
Author(s): J. J. Rocca; F. J. Furch; B. A. Reagan; Y. Wang; D. Alessi; D. Martz; B. Luther; M. Berrill; S. Domingue; D. Kemp; F. Pedaci; V. N. Shlyaptsev; M. Marconi; C. S. Menoni
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Paper Abstract

We report new advances in the development of high repetition rate table-top soft x-ray lasers. We have extended the gain-saturated operation of these lasers to 10.9 nm demonstrating a 1 Hz repetition rate laser operation in Ni-like tellurium with an average power of 1 microwatt. In a separate development we have demonstrated the first all-diodepumped soft x-ray laser. Lasing was achieved in the 18.9 nm line of Ni-like molybdenum in a plasma heated by a compact all-diode-pumped Yb:YAG laser. The solid state pump laser produces 8.5 ps pulses with up to 1 J energy at 10 Hz repetition rate. This diode-pumped laser has the potential to greatly increase the repetition rate and average power of soft x-ray lasers on a significantly smaller footprint. These compact soft X-ray lasers offer new scientific opportunities in small laboratory environments.

Paper Details

Date Published: 29 September 2009
PDF: 9 pages
Proc. SPIE 7451, Soft X-Ray Lasers and Applications VIII, 745106 (29 September 2009); doi: 10.1117/12.826349
Show Author Affiliations
J. J. Rocca, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
F. J. Furch, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
B. A. Reagan, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
Y. Wang, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
D. Alessi, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
D. Martz, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
B. Luther, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
M. Berrill, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
S. Domingue, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
D. Kemp, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
F. Pedaci, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
V. N. Shlyaptsev, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
M. Marconi, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)
C. S. Menoni, NSF Engineering Research Ctr. for Extreme Ultraviolet Science and Technology, Colorado State Univ. (United States)


Published in SPIE Proceedings Vol. 7451:
Soft X-Ray Lasers and Applications VIII
James Dunn; Gregory J. Tallents, Editor(s)

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