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Proceedings Paper

Quantitative comparison of a new DM technology
Author(s): Roger Hamelinck; Nick Rosielle; Maarten Steinbuch; Niek J. Doelman
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Proc. SPIE 7466, Advanced Wavefront Control: Methods, Devices, and Applications VII, ; doi: 10.1117/12.826100
Show Author Affiliations
Roger Hamelinck, TNO Science and Industry (Netherlands)
Nick Rosielle, Technische Univ. Eindhoven (Netherlands)
Maarten Steinbuch, Technische Univ. Eindhoven (Netherlands)
Niek J. Doelman, TNO Science and Industry (Netherlands)


Published in SPIE Proceedings Vol. 7466:
Advanced Wavefront Control: Methods, Devices, and Applications VII
Richard A. Carreras; Troy A. Rhoadarmer; David C. Dayton, Editor(s)

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