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Proceedings Paper

Using holographic optical tweezers to measure forces with SPM-like probes
Author(s): J. A. Grieve; D. M. Carberry; L. Ikin; G. M. Gibson; M. J. Padgett; M. J. Miles
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Paper Abstract

Holographic optical tweezers are used to assemble and control probes made from high aspect-ratio CdS and SiO2 nanorods and SiO2 microspheres. Analysis of the probe position allows for the measurement of forces experienced by the tip in a manner analogous to existing scanning probe microscopy (SPM) techniques.

Paper Details

Date Published: 28 August 2009
PDF: 6 pages
Proc. SPIE 7400, Optical Trapping and Optical Micromanipulation VI, 74001X (28 August 2009); doi: 10.1117/12.826027
Show Author Affiliations
J. A. Grieve, Univ. of Bristol (United Kingdom)
D. M. Carberry, Univ. of Bristol (United Kingdom)
L. Ikin, Univ. of Bristol (United Kingdom)
G. M. Gibson, Univ. of Glasgow (United Kingdom)
M. J. Padgett, Univ. of Glasgow (United Kingdom)
M. J. Miles, Univ. of Bristol (United Kingdom)

Published in SPIE Proceedings Vol. 7400:
Optical Trapping and Optical Micromanipulation VI
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

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