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Proceedings Paper

Design, assembly, and testing of a high-resolution relay lens used for holography with operation at both doubled and tripled Nd:YAG laser wavelengths
Author(s): Robert M. Malone; Gene A. Capelle; Brian C. Cox; Brent C. Frogget; Mike Grover; Morris I. Kaufman; Peter Pazuchanics; Danny S. Sorenson; Gerald D. Stevens; Aric Tibbitts; William D. Turley
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Paper Abstract

The design and assembly of a nine-element lens that achieves >2000 lp/mm resolution at a 355-nm wavelength (ultraviolet) has been completed. By adding a doublet to this lens system, operation at a 532-nm wavelength (green) with >1100 lp/mm resolution is achieved. This lens is used with high-power laser light to record holograms of fast-moving ejecta particles from a shocked metal surface located inside a test package. Part of the lens and the entire test package are under vacuum with a 1-cm air gap separation. Holograms have been recorded with both doubled and tripled Nd:YAG laser light. The UV operation is very sensitive to the package window's tilt. If this window is tilted by more than 0.1 degrees, the green operation performs with better resolution than that of the UV operation. The setup and alignment are performed with green light, but the dynamic recording can be done with either UV light or green light. A resolution plate can be temporarily placed inside the test package so that a television microscope located beyond the hologram position can archive images of resolution patterns that prove that the calibration wires, interference filter, holographic plate, and relay lenses are in their correct positions. Part of this lens is under vacuum, at the point where the laser illumination passes through a focus. Alignment and tolerancing of this high-resolution lens are presented. Resolution variation across the 12-mm field of view and throughout the 5-mm depth of field is discussed for both wavelengths.

Paper Details

Date Published: 21 August 2009
PDF: 12 pages
Proc. SPIE 7433, Optical System Alignment, Tolerancing, and Verification III, 74330L (21 August 2009); doi: 10.1117/12.825812
Show Author Affiliations
Robert M. Malone, National Security Technologies, LLC (United States)
Gene A. Capelle, National Security Technologies, LLC (United States)
Brian C. Cox, National Security Technologies, LLC (United States)
Brent C. Frogget, National Security Technologies, LLC (United States)
Mike Grover, National Security Technologies, LLC (United States)
Morris I. Kaufman, National Security Technologies, LLC (United States)
Peter Pazuchanics, Los Alamos National Lab. (United States)
Danny S. Sorenson, Los Alamos National Lab. (United States)
Gerald D. Stevens, National Security Technologies, LLC (United States)
Aric Tibbitts, National Security Technologies, LLC (United States)
William D. Turley, National Security Technologies, LLC (United States)


Published in SPIE Proceedings Vol. 7433:
Optical System Alignment, Tolerancing, and Verification III
José Sasián; Richard N. Youngworth, Editor(s)

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