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Proceedings Paper

1D-KBA microscope using double-periodic multilayer
Author(s): Baozhong Mu; Zhanshan Wang; Shengzhen Yi; Jingtao Zhu; Xin Wang; Li Jiang; Qiushi Huang; Yuhong Bai
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Paper Abstract

To study the action of shock wave in CH target, one-dimensional grazing incidence KBA microscope for 4.75keV energy was set up. Because of strong absorption in air, 4.75keV energy microscope can just work in vacuum. Accordingly, the alignment and assemblage will be very complicated and difficult. A special multilayer method, using double periodic multilayer, was proposed to solve this problem. This multilayer has high reflectivity not only for 4.75keV x-rays but also for 8keV x-rays at the same grazing incidence angle. It means 1D-KBA microscope has the same light trace for different working energies. Therefore, we can implement the alignment and assembly of 4.75keV system by the help of 8keV x-rays. Because 8keV x-rays is very easy produced by x-ray tube and has strong transmittability in air, the alignment and assemblage process became relatively easy. By now, we have finished the alignment experiment at 8keV and obtained imaging results. The performance is about 2-3μm resolution in 250μm field of view. It is coincide with the calculation.

Paper Details

Date Published: 8 September 2009
PDF: 6 pages
Proc. SPIE 7448, Advances in X-Ray/EUV Optics and Components IV, 74480K (8 September 2009); doi: 10.1117/12.825767
Show Author Affiliations
Baozhong Mu, Tongji Univ. (China)
Zhanshan Wang, Tongji Univ. (China)
Shengzhen Yi, Tongji Univ. (China)
Jingtao Zhu, Tongji Univ. (China)
Xin Wang, Tongji Univ. (China)
Li Jiang, Tongji Univ. (China)
Qiushi Huang, Tongji Univ. (China)
Yuhong Bai, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7448:
Advances in X-Ray/EUV Optics and Components IV
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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