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Proceedings Paper

Methods for TEM analysis of NIST's single-walled carbon nanotube Standard Reference Material
Author(s): Elisabeth Mansfield; Roy Geiss; Jeffrey A. Fagan
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Paper Abstract

The National Institute of Standards and Technology (NIST) will soon release a series of single-walled carbon nanotube (SWCNT) reference materials (RMs) to provide users with a well-characterized material for their applications. The SWCNT reference material will be introduced as a series of three types of material: (1) raw soot characterized for composition, which will be certified as a Standard Reference Material, (2) purified (greater than 90 % SWCNT by weight) bucky paper and (3) dispersed, length-sorted populations characterized by length. The instrumental characterization of NIST's SWCNT reference materials is extensive, and this paper aims to provide researchers with dispersion preparation methods for TEM (transmission electron microscopy) analysis of the SWCNT raw soot. A selection of dispersing solvents, including organic solvents, aqueous surfactants and DNA dispersions, were prepared and examined by TEM. Recommendations for sample preparation of the SWCNT SRM 2483 to yield images similar to those presented here are given. Examples of images of the length-sorted SWCNT reference material are also shown. These results illustrate the importance of optimal dispersion to enable imaging of SWCNT characteristics.

Paper Details

Date Published: 21 August 2009
PDF: 11 pages
Proc. SPIE 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III, 74050A (21 August 2009); doi: 10.1117/12.825406
Show Author Affiliations
Elisabeth Mansfield, National Institute of Standards and Technology (United States)
Roy Geiss, National Institute of Standards and Technology (United States)
Jeffrey A. Fagan, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 7405:
Instrumentation, Metrology, and Standards for Nanomanufacturing III
Michael T. Postek; John A. Allgair, Editor(s)

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