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Proceedings Paper

High frequency ultrasound phased array characterization of SiC mirror blanks
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Paper Abstract

Silicon carbide mirror blank materials were characterized using ultrasound phased array technology to determine the feasibility of using this method for rapidly characterizing material homogeneity and locate anomalous flaws. A 10MHz 64 element linear probe was used to measure and image the top and bottom surface reflected signal peak amplitudes. C-scan images located the presence of possible sub-surface heterogeneities as well as surface scratches invisible to the eye. Bottom surface scans located variations in homogeneity within the sample bulk. High frequency ultrasound phased array was found to be well suited for detailed characterization of SiC mirror blanks.

Paper Details

Date Published: 21 August 2009
PDF: 8 pages
Proc. SPIE 7425, Optical Materials and Structures Technologies IV, 742508 (21 August 2009); doi: 10.1117/12.825096
Show Author Affiliations
Richard A. Haber, Rutgers Univ. (United States)
Andrew Portune, Rutgers Univ. (United States)


Published in SPIE Proceedings Vol. 7425:
Optical Materials and Structures Technologies IV
Joseph L. Robichaud; William A. Goodman, Editor(s)

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