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Proceedings Paper

Specific energy yield comparison between crystalline silicon and amorphous silicon based PV modules
Author(s): Toby Ferenczi; Omar Stern; Marianne Hartung; Eike Mueggenburg; Mark Lynass; Eva Bernal; Oliver Mayer; Marcus Zettl
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Paper Abstract

As emerging thin-film PV technologies continue to penetrate the market and the number of utility scale installations substantially increase, detailed understanding of the performance of the various PV technologies becomes more important. An accurate database for each technology is essential for precise project planning, energy yield prediction and project financing. However recent publications showed that it is very difficult to get accurate and reliable performance data of theses technologies. This paper evaluates previously reported claims the amorphous silicon based PV modules have a higher annual energy yield compared to crystalline silicon modules relative to their rated performance. In order to acquire a detailed understanding of this effect, outdoor module tests were performed at GE Global Research Center in Munich. In this study we examine closely two of the five reported factors that contribute to enhanced energy yield of amorphous silicon modules. We find evidence to support each of these factors and evaluate their relative significance. We discuss aspects for improvement in how PV modules are sold and identify areas for further study further study.

Paper Details

Date Published: 20 August 2009
PDF: 8 pages
Proc. SPIE 7410, Optical Modeling and Measurements for Solar Energy Systems III, 74100K (20 August 2009); doi: 10.1117/12.825061
Show Author Affiliations
Toby Ferenczi, GE Global Research Europe (Germany)
Omar Stern, GE Global Research Europe (Germany)
Marianne Hartung, GE Global Research Europe (Germany)
Eike Mueggenburg, GE Global Research Europe (Germany)
Mark Lynass, GE Global Research Europe (Germany)
Eva Bernal, GE Global Research Europe (Germany)
Oliver Mayer, GE Global Research Europe (Germany)
Marcus Zettl, GE Global Research Europe (Germany)

Published in SPIE Proceedings Vol. 7410:
Optical Modeling and Measurements for Solar Energy Systems III
Benjamin K. Tsai, Editor(s)

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